On October 9th-13th, our group members Yuanyuan Shi (visiting at Stanford Univerisity), Fei Hui (visiting at the Massachusetts Institute of Technology) and Mario Lanza participate in the 2016 IIRW conference in Stanford Sierra Conference Center (USA). In the conference, Professor Mario Lanza gave an invited talk titled “Reliability of electronic devices: nanoscale studies based on the conductive atomic force microscope”. That was a great opportunity to discuss with world experts in electronic devices reliability.
We participate in 2016 International Integrated Reliability Workshop
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