Professor Lanza has recently signed an agreement with Wiley-VCH publishing group to edit the first ever book completely dedicated to conductive atomic force microscope (CAFM) and related electrical modes of AFM. Professor Lanza has ten years experience on the use of this equipment, and for this book he has formed a group of world leading scientists in the field. The list of confirmed contributors is formed by: Wilfried Vandervorst and Umberto Celano (IMEC), Kin Leong Pey (Nanyang Technological University), Filippo Giannazzo (STMicroelectronics), David Lewis (CEO of Nanonics), Louis Pacheco (Scientec), Oliver Krause (Nano World), Lidia Aguilera (Knowledge Innovation Market), Guenther Benstetter (Deggendorf Institute of Technology, Germany) and Enzo di Fabrizio (King Abdullah University of Science and Technology), among others. The book will be published in March 2016, and it will have the support and visibility provided by Wiley-VCH.
Professor Lanza is appointed as guest editor of a Wiley-VCH book
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