Monthly Archives: July 2015

Professor Lanza is appointed as guest editor of a Wiley-VCH book

Professor Lanza has recently signed an agreement with Wiley-VCH publishing group to edit the first ever book completely dedicated to conductive atomic force microscope (CAFM) and related electrical modes of AFM. Professor Lanza has ten years experience on the use

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International Symposium on Two-dimensional Materials

The members of our group, Yanfeng Ji, Chengbin Pan, Xiaoxue Song and Tingting Han, as well as professor Lanza participate in the International Symposium on Physics and Device Application of Two-dimensional Materials, organized by professors Yi Shi and Xinran Wang

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Our group participates in the IPFA 2015 conference organized by the IEEE

The members of our group, Yanfeng Ji and Mario Lanza participate in the 22th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits in Taiwan, on June 28th-July 3rd of 2015. Professor Mario presented an oral speech about

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